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A Method for Optimum Test Point Selection and Fault Diagnosis Strategy for BIT of Avionic System

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3 Author(s)
Dong Song ; Coll. of Aeronaut., Northwestern Polytech. Univ., Xi''an ; Qiong Hu ; Chuanqing Wang

A method for optimum test point selection and the fault diagnosis strategy which is based on the fault message matrix and features of BIT is proposed. The fault message matrix is divided based on the weight of the test points The diagnosis strategy is determined using dividing the fault message matrix and the thought of detecting first and isolating next. Result shows that the optimum method is suitable for BIT to select the appropriate test points and fault diagnosis procedure. Besides, average numbers of test steps were reduced.

Published in:

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Date of Conference:

28-29 April 2009