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A Low-Cost Output Response Analyzer Circuit for ADC BIST

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5 Author(s)
Hsin-Wen Ting ; Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan ; I-Jen Chao ; Yu-Chang Lien ; Soon-Jyh Chang
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In this paper, a low-cost ADC output response analyzer (ORA) circuit for built-in self-test (BIST) application is proposed. The sine-wave histogram testing method and the basic coordinate rotation digital computer (CORDIC) technique are used to design the proposed ADC ORA circuit. The ADC's static and dynamic parameters can both be obtained using the proposed circuit. The basic CORDIC based ADC ORA circuit is designed and synthesized in a 0.18-mum technology to analyze the outputs an 8-bit ADC to verify the designs. It shows a lower area overhead compared with the fast Fourier transform (FFT) based realization.

Published in:

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Date of Conference:

28-29 April 2009

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