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The following topics are dealt with: next generation instruments and systems;board and system test and diagnosis monitoring, diagnosis and prognostic methods; system-on-chip test mixed-signal and analog test diagnosis for analog circuits; RF/MW/MM test and instrument data acquisition; design-for-test (DFT) BIT/BIST;reliability and design for reliability; test generation fault model and fault simulation high-speed digital test fault tolerance; and test and diagnosis for submicron circuits test and diagnosis of biomedical CAS optoelectronics/test.

Published in:

Testing and Diagnosis, 2009. ICTD 2009. IEEE Circuits and Systems International Conference on

Date of Conference:

28-29 April 2009