Referenced Items are not available for this document.
Simultaneous switching noise (SSN) on power supply lines is caused by the large switching transient currents flowing through parasitic inductances at the chip-package-pin interface. A new expression to estimate SSN in CMOS circuits that includes the velocity saturation effects seen in the short-channel MOSFETs is derived. SPICE Level 3 simulation results show that the formula predicts the SSN more accurately as compared to existing approaches for submicron processes even at reduced supply voltages
Published in:
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
(Volume:19
,
Issue:
2
)
Date of Publication: May 1996
- Page(s):
- 344 - 349
- ISSN :
- 1070-9894
- INSPEC Accession Number:
- 5275755
- Digital Object Identifier :
- 10.1109/96.496038
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- May 1996
- Sponsored by :
- IEEE Components, Packaging, and Manufacturing Technology Society
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