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Accurate simultaneous switching noise estimation including velocity-saturation effects

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1 Author(s)
Vemuru, Srinivasa R ; Dept. of Electr. Eng., City Univ. of New York, NY, USA

Simultaneous switching noise (SSN) on power supply lines is caused by the large switching transient currents flowing through parasitic inductances at the chip-package-pin interface. A new expression to estimate SSN in CMOS circuits that includes the velocity saturation effects seen in the short-channel MOSFETs is derived. SPICE Level 3 simulation results show that the formula predicts the SSN more accurately as compared to existing approaches for submicron processes even at reduced supply voltages

Published in:

Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on  (Volume:19 ,  Issue: 2 )