Close category search window
 

Dynamics studies in magnetic bilayer Fe/Au/Fe(001) structures using network analyzer measurements

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Mosendz, O. ; Simon Fraser University, 8888 University Drive, Burnaby, British Columbia, V5A 1S6, Canada ; Kardasz, B. ; Heinrich, B.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2173221 

Fe/Au/Fe(001) ultrathin film structures were grown by molecular beam epitaxy on 4×6 reconstructed GaAs(001) substrates. A microwave network analyzer was used to carry out ferromagnetic resonance (FMR) measurements down to microwave frequency of 1 GHz. The FMR results indicate that the crystalline ultrathin Fe films are of high crystalline quality. The FMR linewidth is mostly given by the intrinsic Gilbert damping and is only weakly affected by small local variations of the internal anisotropy fields. The study at low microwave frequency allowed one to investigate the spin-pumping mechanism in the configuration of noncollinear magnetic moments.

Published in:
Journal of Applied Physics  (Volume:99 ,  Issue: 8 )

Date of Publication: Apr 2006

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.