Cart (Loading....) | Create Account
Close category search window

Reduction of grain size and intergrain interaction in FePt/Pt/Cr trilayer thin films for perpendicular magnetic recording

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Sun, An-Cheng ; Department of Physics and Center for Nanostorage Research, National Taiwan University, Taipei 106, Taiwan ; Jen-Hwa Hsu ; Huang, H.L. ; Kuo, P.C.

Your organization might have access to this article on the publisher's site. To check, click on this link: 

A FePt single layer, a FePt/Cr bilayer, and a FePt/Pt/Cr trilayer were fabricated. Transmission electron microscope images revealed that the grain size of a FePt single layer was around 50 nm, and decreased to 20 nm with a Cr underlayer. When a Pt layer was inserted between the FePt magnetic layer and the Cr underlayer, L10 FePt(001) thin films with perpendicular magnetic properties can be obtained with a grain size of around 20 nm determined primarily by the Cr underlayer. The intergranular interactions determined from the Kelly-Henkel plot were the exchange coupling between magnetic grains in the FePt single layer. In contrast, negative values of the δM curve were obtained for the FePt/Cr bilayer and the FePt/Pt/Cr trilayer, implying the presence of dipole interactions in both films. Smaller grains and the negative δM of FePt/Cr were derived from the diffusion of Cr into the FePt layer.

Published in:

Journal of Applied Physics  (Volume:99 ,  Issue: 8 )

Date of Publication:

Apr 2006

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.