By Topic

Properties of a dielectric probe for scanning near-field millimeter-wave microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kume, Eiji ; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan ; Sakai, Shigeki

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The characteristics of a dielectric probe for scanning near-field millimeter wave microscopy are presented in this paper. The dielectric probe was fabricated from Teflon and shaped like a cone. The beam profile of the millimeter-wave radiated from the tip of the Teflon probe was measured by three-dimensional scanning using a different Teflon probe. The 93.5 GHz millimeter wave was focused on the tip of the probe at the wavelength level, and the millimeter-wave power was found to decrease exponentially with distance from the tip, the same as a near-field wave.

Published in:

Journal of Applied Physics  (Volume:99 ,  Issue: 5 )