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Properties of a dielectric probe for scanning near-field millimeter-wave microscopy

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2 Author(s)
Kume, Eiji ; National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan ; Sakai, Shigeki

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The characteristics of a dielectric probe for scanning near-field millimeter wave microscopy are presented in this paper. The dielectric probe was fabricated from Teflon and shaped like a cone. The beam profile of the millimeter-wave radiated from the tip of the Teflon probe was measured by three-dimensional scanning using a different Teflon probe. The 93.5 GHz millimeter wave was focused on the tip of the probe at the wavelength level, and the millimeter-wave power was found to decrease exponentially with distance from the tip, the same as a near-field wave.

Published in:

Journal of Applied Physics  (Volume:99 ,  Issue: 5 )