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Exchange coupling in NiO/CoFe2 and CoFe2O4/CoFe2 systems grown by pulsed laser deposition

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7 Author(s)
Fix, T. ; Institut de Physique et Chimie des Matériaux de Strasbourg (IPCMS), Unité Mixte de Recherche 7504 du Centre National de la Recherche Scientifique (CNRS), Ecole Européenne de Chimie, Polymères et Matériaux de Strasbourg (ECPM), Université Louis Pasteur, 23 Rue du Loess BP43 F-67034 Strasbourg, France ; Colis, S. ; Sauvet, K. ; Loison, J.L.
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NiO(30 nm)/CoFe2(5 nm) bilayers are grown by pulsed laser deposition on Si (001). After annealing under a magnetic field we observe an exchange bias of -86 Oe, corresponding to an exchange coupling of 0.06 erg/cm2. While a similar exchange coupling is observed in NiO(30 nm)/CoFe2(5 nm)/SrTiO3(3 nm)/Ni80Fe20(5 nm)/Ta(5 nm), the stack SFMO(30 nm)/SrTiO3(3 nm)/CoFe2(5 nm)/NiO(30 nm)/Ta(5 nm) does not provide any exchange bias with NiO on the top electrode. Alternatively, we have used a ferrimagnetic oxide (CoFe2O4) as a bias layer of the top electrode. The stack SFMO(30 nm)/STO(3 nm)/CoFe2(5 nm)/CoFe2O4(70 nm) provides a shift of -70 Oe for the CoFe2(5 nm) layer, corres- ponding to an exchange coupling of 0.05 erg/cm2.

Published in:

Journal of Applied Physics  (Volume:99 ,  Issue: 4 )

Date of Publication:

Feb 2006

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