By Topic

Conducting Ni nanoparticles in an ion-modified polymer

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Sze, J.Y. ; School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798 ; Tay, B.K. ; Pakes, C.I. ; Jamieson, D.N.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2014938 

Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis.

Published in:

Journal of Applied Physics  (Volume:98 ,  Issue: 6 )