Close category search window
 

Gold nanoclusters on amorphous carbon synthesized by ion-beam deposition

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Thune, Elsa ; Universität Göttingen, II. Physikalisches Institut, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germany ; Carpene, Ettore ; Sauthoff, Katharina ; Seibt, Michael
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1985977 

Gold clusters have been deposited by a monoenergetic, mass-selected ion beam with low energies (20–350 eV) on amorphous carbon substrates in order to minimize the influence of the surface crystallinity and the ion-induced structural changes. Gold has been used as a model system, due to the poor reactivity with carbon, to study the ion-energy dependence, the temporal evolution, and the influence of the temperature on the cluster distribution. The cluster size is very sensitive to the energy and the mean size strongly decreases from 4 to less than 1 nm as the ion energy increases. We can also note that the size distribution becomes broader. For impact energies below 100 eV, surface processes dominate the cluster nucleation and growth. If higher energies are used, an increasing number of ions is implanted below the surface and different processes control the cluster formation. When the energy increases above 350 eV, the cluster size drastically drops below 5 nm. The samples are analyzed with different methods such as atomic force microscopy, transmission electron microscopy, and x-ray photoelectron spectroscopy to determine their size distribution, composition, and structure.

Published in:
Journal of Applied Physics  (Volume:98 ,  Issue: 3 )

Date of Publication: Aug 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.