Close category search window
 

Near-field scanning optical microscopy of ZnO nanopatterns fabricated by micromolding in capillaries

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Donthu, S.K. ; Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 ; Pan, Z. ; Shekhawat, G.S. ; Dravid, V.P.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1949712 

We report near-field scanning optical microscopy (NSOM) studies of 300-nm-wide ZnO nanopatterns fabricated by micromolding in capillary technique using a sol-gel route. Atomic force microscopy and scanning electron microscopy show that the patterns are continuous with uniform linewidths. Simultaneous topography and optical signal collected in NSOM scans exhibit nanoscale photoluminescence intensity distribution in the ZnO nanopatterns. The nanoscale spectral mapping shows very broad defect-induced green-yellow-red luminescence bands, at room temperature, when excited with a 514.5-nm Ar-ion laser. Our analyses demonstrate that spatially resolved ZnO luminescence features with an optical resolution of ≤300 nm can be obtained with NSOM while operating in collection mode, and underscore the need to couple nanoscale physical characterization with functional properties at the same scale.

Published in:
Journal of Applied Physics  (Volume:98 ,  Issue: 2 )

Date of Publication: Jul 2005

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.