Cart (Loading....) | Create Account
Close category search window

Studies of magnetic properties and giant magnetoimpedance effect in ultrathin magnetically soft amorphous microwires

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Zhukova, V. ; Departamento de Física Aplicada, EUPDS, UPV/EHU, 200018 San Sebastian, Spain ; Ipatov, M. ; Gonzalez, J. ; Blanco, J.M.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

We report novel results on studies of giant magnetoimpedance (GMI) effect and magnetic properties in ultrathin amorphous glass-coated microwires with nearly zero and negative magnetostriction constant and metallic nucleus diameter ranging within 6 and 12 μm. Off-diagonal MI curve of Co67.1Fe3.8Ni1.4Si14.5B11.5Mo1.7 microwire exhibits asymmetrical shape with almost linear growth within the field range from -Hm to Hm associated with the anisotropy field. Co74B13Si11C2 microwire possesses hysteretic off-diagonal MI curve. Current annealing significantly changes off-diagonal MI curves, especially in the case of Co74B13Si11C2 microwire.

Published in:

Journal of Applied Physics  (Volume:103 ,  Issue: 7 )

Date of Publication:

Apr 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.