Ferromagnetic resonance has been used to study the magnetic properties and magnetization dynamics of polycrystalline Fe1-xVx alloy films with 0≤x≪0.7. Films were produced by cosputtering from separate Fe and V targets, leading to a composition gradient across a Si substrate. Ferromagnetic resonance studies were conducted at room temperature with a broadband coplanar waveguide at frequencies up to 50 GHz using the flip-chip method. The effective demagnetization field 4πMeff and the Gilbert damping parameter α have been determined as a function of V concentration. The results are compared to those of epitaxial FeV films.