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Theoretical investigation on force sensitivity in Q-controlled phase-modulation atomic force microscopy in constant-amplitude mode

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5 Author(s)
Kobayashi, Naritaka ; Department of Applied Physics, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan ; Li, Yan Jun ; Naitoh, Yoshitaka ; Kageshima, Masami
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We theoretically investigate the force sensitivity of phase-modulation atomic force microscopy in the constant amplitude mode with Q-control technique, which enables to increase or decrease the effective Q factor (Qeff) of the cantilever. The relation between the minimum detectable interaction force and the effective Q factor is derived from the equation of motion for the cantilever at low Q environment such as liquid environment. It indicates that the minimum detectable interaction force can be reduced in proportion to Qeff1/2 under strong Q enhancement, while it does not depend on the effective Q factor under weak Q enhancement.

Published in:

Journal of Applied Physics  (Volume:103 ,  Issue: 5 )

Date of Publication:

Mar 2008

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