Cart (Loading....) | Create Account
Close category search window

Estimation of the Lyman-α line intensity in a lithium-based discharge-produced plasma source

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Masnavi, Majid ; Department of Energy Sciences, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8502, Japan ; Nakajima, Mitsuo ; Hotta, E. ; Horioka, Kazuhiko

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Extreme ultraviolet (EUV) discharge-based lamps for EUV lithography need to generate extremely high power in the narrow spectrum band of 13.5±0.135 nm. A simplified time-dependent collisional-radiative model and radiative transfer solution were utilized to investigate the wavelength-integrated Lyman-α line light outputs in a hydrogen-like lithium ion. The study reveals in particular that a steady-state or magnetically confined lithium plasma radiates in the desired spectrum band not less than 1 kW in 2π sr even at an ion density region as low as 1017 cm-3.

Published in:

Journal of Applied Physics  (Volume:103 ,  Issue: 1 )

Date of Publication:

Jan 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.