Close category search window
 

Lateral heat flow method for thickness independent determination of thermal diffusivity

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Tralshawala, N. ; GE Global Research Center, 1 Research Circle, Niskayuna, New York 12309, USA ; Howard, Donald R. ; Knight, Bryon ; Plotnikov, Yuri
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2798581 

A pulsed transient thermography method is described where a high-intensity light pulse is used to heat a long, uniform stripe on the surface of a plate. A high spatial resolution, high frame rate focal plane array infrared camera is used to monitor surface temperature. We explain the theoretical model and data analysis framework used to experimentally determine all three thermal diffusivity components from the temperature measurements. The analysis does not require any fitting to the temperature profile and is based on the creation of thermal time-of-flight (tof) images from the temperature data and the relationship between tof and the distance from the stripe edge. The in-plane components of thermal diffusivity are obtained without the need for thickness information. Experimental validation of this procedure was carried out using anisotropic carbon fiber reinforced polymer composites.

Published in:
Journal of Applied Physics  (Volume:102 ,  Issue: 8 )

Date of Publication: Oct 2007

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.