By Topic

Imaging concentric modulations in transverse modes of a vertical-cavity surface emitting laser using a scanning near-field optical microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Holton, M.D. ; Department of Physics, School of Physical Sciences, Swansea University, Singleton Park, Swansea SA2 8PP, United Kingdom ; Rees, P. ; Dunstan, P.R.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2423138 

Concentric standing waves have been spatially imaged in the near-field regime within the optical aperture of a vertical-cavity surface emitting laser (VCSEL) using a scanning near-field optical microscope. Using the microscope’s near-field collection mode and subsequent detection via a spectrometer it has been possible to design an experiment to determine the spatial location of multiple lasing modes in addition to concentric standing waves. At low injection current above threshold the standing waves influence and modulate the optical emission from multiple transverse modes. These results are discussed in relation to cavity and aperture effects, and pattern formation in VCSELs. Surface defects arising in the aperture are also seen to affect the optical output and are briefly discussed.

Published in:

Journal of Applied Physics  (Volume:101 ,  Issue: 2 )