Cart (Loading....) | Create Account
Close category search window

Conductivity profile determination by eddy current for shot-peened superalloy surfaces toward residual stress assessment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Shen, Y. ; Center for NDE, Iowa State University, Ames, Iowa 50011 ; Lee, C. ; Lo, C.C.H. ; Nakagawa, N.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

This paper demonstrates a swept high frequency eddy current (SHFEC) methodology that can determine near-surface conductivity deviation profiles of shot-peened superalloy surfaces, from which residual stress state can be assessed nondestructively. Our methodology is built around a laboratory-grade SHFEC hardware and a model-based SHFEC data inversion software, both described in this article. For the demonstration, a series of shot-peened Inconel 718 block specimens is prepared and examined by the proposed SHFEC inversion technique. The conductivity depth profiles of the samples under various shot peening intensities have been obtained by the inversion. Several sensitivity and consistency test results are given to support the reliability of the inverted conductivity profiles. The extreme near-surface regions (10–20 μm) of the shot-peened surfaces are also examined by various microstructural characterization methods such as scanning electron microscopy, energy dispersive x-ray spectroscopy, and x-ray diffraction, to examine our inversion results microscopically.

Published in:

Journal of Applied Physics  (Volume:101 ,  Issue: 1 )

Date of Publication:

Jan 2007

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.