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A compact quantum model of nanoscale double-gate metal-oxide-semiconductor field-effect transistor for high frequency and noise simulations

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4 Author(s)
Roldan, A.M. ; Departament d’Enginyeria Electrónica, Eléctrica i Automática, Universitat Rovira i Virgili, 43007 Tarragona, Spain ; Nae, B. ; Moldovan, O. ; Iniguez, B.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2360379 

In this paper, we present an analytical model for high frequency and microwave noise model of nanoscale double-gate metal-oxide-semiconductor field-effect transistor. The model is based on a compact model for charge quantization within the channel and it includes overshoot velocity effects. Radio-frequency and noise performances are calculated using an active transmission line method. A comparison is made between classical and quantum charge control and between drift diffusion and hydrodynamic models.

Published in:
Journal of Applied Physics  (Volume:100 ,  Issue: 8 )

Date of Publication: Oct 2006

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