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X-ray photoelectron spectroscopic and secondary ion mass spectroscopic examinations of metallic-lithium-activated donor doping process on La0.56Li0.33TiO3 surface at room temperature

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3 Author(s)
Yang, Kai-Yun ; Department of Materials Science and Engineering, National Cheng Kung University, No. 1, Ta-Hsueh Road, Tainan 70101, Taiwan ; Fung, Kuan-Zong ; Wang, Moo-Chin

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The donor doping process at the interface between the cation-deficient La0.56Li0.33TiO3 and lithium was elucidated by x-ray photoelectron spectroscopy (XPS) and secondary ion mass spectroscopy (SIMS). XPS revealed a chemical shift (∼1.48 eV) from the main peak of Ti4+ 2p3/2 toward the low energy side, due to the conversion of 12% Ti4+ to Ti3+. The SIMS analysis indicates that a local electric field was responsible for the insertion of oxidized 6Li+ isotope ions. The doping with Ti3+ donors, accompanying the insertion of Li+ ions into cation vacancies of La0.56Li0.33TiO3, yields the n-type semiconducting characteristics at room temperature.

Published in:

Journal of Applied Physics  (Volume:100 ,  Issue: 5 )

Date of Publication:

Sep 2006

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