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Electrostatic properties of individually separated single-walled carbon nanotubes (SWCNTs), double-walled carbon nanotubes (DWCNTs), and multiwalled carbon nanotubes (MWCNTs) deposited on insulating layers have been investigated by charge injection and electric force microscopy (EFM) experiments. Delocalized charge patterns are observed along the CNTs upon local injection from the EFM tip, corresponding to (i) charge storage in the nanotubes and to (ii) charge trapping in the oxide layer along the nanotubes. The two effects are dissociated easily for CNTs showing abrupt discharge processes in which the charge stored in the CNT are field emitted back to the EFM tip, while trapped oxide charge can subsequently be imaged by EFM, clearly revealing field-enhancement patterns at the CNT caps. The case of continuous discharge processes of SWCNTs, DWCNTs, and MWCNTs is discussed, as well as the evolution of the discharge time constants with respect to the nanotube diameter.