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Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults

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5 Author(s)
Jaehoon Song ; Dept. of Comput. Sci. & Eng., Hanyang Univ., Ansan, South Korea ; Juhee Han ; Hyunbean Yi ; Taejin Jung
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The effect of crosstalk-induced errors becomes more significant in high-performance circuits and systems. In this paper, compact crosstalk test patterns are introduced for a system-on-a-chip and board level interconnects considering physically effective aggressors. By being able to target multiple victim lines, 6n, where n is the number of nets patterns are drastically reduced to a constant number 6D, where D indicates the effective distance among interconnect nets. The test quality for static and crosstalk faults are completely preserved with 6D patterns.

Published in:

Circuits and Systems II: Express Briefs, IEEE Transactions on  (Volume:56 ,  Issue: 5 )

Date of Publication:

May 2009

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