By Topic

Quantitative Study of Optical Frequency Noise to Intensity Noise Conversion in Line-by-Line Pulse Shaping

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Chen-Bin Huang ; Inst. of Photonics Technol., Nat. Tsing Hua Univ., Hsinchu ; Zhi Jiang ; Leaird, D.E. ; Weiner, A.M.

We report the first quantitative study of intensity noise induced in line-by-line pulse shaping in response to time-varying changes in the comb frequency offset. Controllable comb linewidth broadening is synthesized through frequency dithering of a continuous-wave laser that is fed to a phase modulator. An electrical spectrum analyzer is used to examine the current power spectra of shaped time-domain intensity waveforms subject to comb frequency noise. A theoretical model predicting a 20 dB/decade scaling relation between the dither-induced noise and the frequency dither amplitude is presented. A numerical simulation method capable of predicting the precise form of the RF power spectrum in the presence of optical frequency dithering is explained. Two line-by-line shaping cases are considered in detail. Experimental data are in excellent agreement with the simulated results down to frequency dithers of a few tenths of a percent of the comb spacing. Tolerances to laser frequency fluctuations are given for several simple pulse shaping examples. The effect of pulse shaper parameters is also discussed.

Published in:

Quantum Electronics, IEEE Journal of  (Volume:45 ,  Issue: 6 )