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Browse Journals & Magazines > Journal of Vacuum Science & T ...> Volume:6 Issue:3 Help

Atomic force microscopy and scanning tunneling microscopy with a combination atomic force microscope/scanning tunneling microscope

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4 Author(s)
Marti, O. ; Department of Physics, University of California, Santa Barbara, California 93106 ; Drake, B. ; Gould, S. ; Hansma, P.K.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1116/1.575191 

Since almost all the electronic and mechanical requirements for an atomic force microscope (AFM) are the same as for a scanning tunneling microscope (STM), it is convenient and practical to build a combination AFM/STM with interchangeable heads. The conversion from one to the other can be made in a few minutes. Representative images demonstrate that atomic resolution can be obtained in both modes of operation. With the two modes of operation, it can image conductors, semiconductors, and insulators.

Published in:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  (Volume:6 ,  Issue: 3 )

Date of Publication: May 1988

Page(s):
2089 - 2092
ISSN :
0734-2101
Digital Object Identifier :
10.1116/1.575191
Product Type:
Journals & Magazines
Date of Current Version :
18 June 2009
Issue Date :
May 1988

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