By Topic

A specification-based adaptive test case generation strategy for open operating system standards

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
A. Watanabe ; Dept. of Inf. Sci., Tokyo Univ., Japan ; K. Sakamura

The paper presents a specification based adaptive test case generation (SBATCG) method for integration testing in an open operating system standards environment. In the SBATCG method, templates describing abstract state transitions are derived from a model based specification, and the templates are refined to the internal structure of each implementation. We adopt the Z notation, one of the most widely used formal specification languages. We conducted mutation analysis to study the fault exposure abilities of the SBATCG method and that of a strategy based only on a specification. In our experiment, we used a Z version of the ITRON2 real time multi task operating system specification and two commercially available ITRON2 implementations. The results of this equipment show that the SBATCG method can achieve a higher fault detecting ability than can the strategy using only a specification

Published in:

Software Engineering, 1996., Proceedings of the 18th International Conference on

Date of Conference:

25-29 Mar 1996