Cart (Loading....) | Create Account
Close category search window

Surface derivatization of nanoscale tungsten probes for interfacial force microscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Graham, J.F. ; Interface Science Western, Department of Chemistry, University of Western Ontario, London, Ontario N6A 5B7 Canada ; Griffiths, K. ; Kovar, M. ; Norton, P.R.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

Interfacial force microscopy is a novel technique for imaging and quantitative determination of the mechanical properties of a material such as elastic modulus, hardness, etc., with nm spatial resolution and nN force resolution. Due to the extreme pressures generated during probe-surface contact (many GPa), passivation of the chemical interactions, specifically adhesion, between the parabaloidal tungsten probe tips (radii 35≪r≪200 nm) and the substrate under investigation is often required. Convenient and effective protective monolayers are not generally available for many substrates, and it is necessary to develop a general procedure for passivation of the tip. We have derivatized tungsten(100) surfaces with the silane coupling agent (octadecyltrichlorosilane, OTS) and applied the same techniques to nm-scale tungsten tips. Force versus displacement (f–d) curves were recorded for the following tip–substrate interactions: underivatized tungsten tip against underivatized Au(111) surface, underivatized tungsten tip against derivatized Au(111) surface (C-18 thiol SAM), and derivatized tungsten tip (OTS) against underivatized Au(111). The data clearly show that the OTS derivatized tips were passivated against adhesive contact even at pressures of many GPa, thereby demonstrating the stability necessary for use in nanoindentation experiments. © 1999 American Vacuum Society.

Published in:

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films  (Volume:17 ,  Issue: 4 )

Date of Publication:

Jul 1999

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.