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Large electro-optic effect in single-crystal Pb(Zr,Ti)O3 (001) measured by spectroscopic ellipsometry

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10 Author(s)
Kang, Tae Dong ; Department of Electrical and Computer Engineering, Virginia Commonwealth University, Richmond, Virginia 23284, USA ; Xiao, Bo ; Avrutin, Vitaliy ; Ozgur, Umit
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Using spectroscopic ellipsometry electro-optic effect was studied in lead zirconate titanate (PZT) thin films grown epitaxially on Nb-doped SrTiO3(001) substrates by RF magnetron sputtering. A uniaxial multilayer model analysis was applied to extract the linear and quadratic electro-optic coefficients from the shifts in the ordinary and extraordinary refractive indices with electric field applied along the (001) direction. The effective linear and quadratic coefficients were measured as -134.6×10-12 m/V and 8.5×10-18 m2/V2, respectively, at a wavelength of 632.8 nm, while the individual linear electro-optic coefficients r33 and r13 were -157.1 and 22 pm/V, respectively. The existence of the linear electro-optic effect in unpoled PZT films was attributed to the presence of a built-in polarization and simultaneous poling during measurements.

Published in:

Journal of Applied Physics  (Volume:104 ,  Issue: 9 )

Date of Publication:

Nov 2008

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