Cart (Loading....) | Create Account
Close category search window

X-ray diffraction study of the damage induced in yttria-stabilized zirconia by swift heavy ion irradiations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Costantini, Jean-Marc ; CEA, DEN, SRMA, F-11191 Gif-sur-Yvette Cedex, France ; Guillet, Francois ; Lambert, Sebastien ; Grebille, Dominique
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The lattice damage was investigated by x-ray diffraction techniques in yttria-stabilized zirconia single crystals with the (100) or (110) orientation upon irradiation with swift heavy ions (from 100-MeV C to 2.6-GeV U) in a broad electronic stopping power range (from about 0.3 to 48 keVnm-1). The θ-2θ scans show that no amorphization or change to a new crystalline phase occurs regardless of the ion and crystal features. However, the rocking curves (ω scans) and reciprocal space mappings show evidence of the mosaicity of the crystals, which is produced above a threshold electronic stopping power between 18 and 27 keVnm-1. This threshold is in agreement with our previous Rutherford backscattering spectroscopy/channeling spectroscopy data. Two kinds of damage phenomena are found: (i) nuclear-collision induced clusters of point defects which generate Bragg peak shifts and broadening in the 2θ-ω and θ-2θ scans, and (ii) electronic-excitation induced lattice damage yielding broad peaks in the ω scans above the stopping power threshold at high fluences.

Published in:

Journal of Applied Physics  (Volume:104 ,  Issue: 7 )

Date of Publication:

Oct 2008

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.