Close category search window
 

First-principles study of structural and energetic properties of A2Hf2O7 (A=Dy, Ho, Er) compounds

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Zu, X.T. ; Department of Applied Physics, University of Electronic Science and Technology of China, Chengdu 610054, People’s Republic of China ; Li, N. ; Gao, F.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.2969662 

The structural and energetic properties of A2Hf2O7 (A=Dy, Ho, Er) compounds have been investigated by means of ab initio total energy calculations. For Er2Hf2O7 the defect fluorite structure is predicted to be more stable than pyrochlore structure, agreeing well with previous experimental [J. Inorg. Nucl. Chem. 31, 2367 (1969); J. Less Common Met. 14, 435 (1968)] and theoretical [J. Am. Ceram. Soc. 85, 2139 (2002)] investigations. In contrast to Er2Hf2O7 pyrochlore, Dy2Hf2O7 and Ho2Hf2O7 prefer pyrochlore structures, which is consistent with the recent experimental observations of Dy2Hf2O7 compound [J. Solid State Chem. 179, 1990 (2006)].

Published in:
Journal of Applied Physics  (Volume:104 ,  Issue: 4 )

Date of Publication: Aug 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.