Close category search window
 

Sensitivity of field-effect biosensors to charge, pH, and ion concentration in a membrane model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
McKinnon, W.R. ; Institute for Microstructural Sciences, National Research Council of Canada, 1200 Montreal Road, Ottawa, Ontario K1A 0R6, Canada ; Landheer, D. ; Aers, G.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3050329 

In field-effect transistors used to detect charged biomolecules (BioFETs), the biomolecules form a charged membrane on the transistor surface. In this paper, the one-dimensional Poisson–Boltzmann equation is used to calculate the charge sensitivity (the sensitivity of the BioFET to changes in biomolecule charge), ion sensitivity (to changes in ion concentration of the solution), or pH sensitivity (to changes in pH of the solution), both analytically and numerically, and the results are compared to models where the charged molecules are represented as an infinitely thin plane. Complexation of ions with the oxide surface is shown to have a negligible effect on parameters typical of devices, but the layer used to tether the charged molecules to the surface could modify the sensitivity considerably.

Published in:
Journal of Applied Physics  (Volume:104 ,  Issue: 12 )

Date of Publication: Dec 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.