Close category search window
 

Grating couplers on porous silicon planar waveguides for sensing applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Wei, X. ; Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, Tennessee 37235, USA ; Kang, C. ; Liscidini, M. ; Rong, G.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.3043579 

We study the use of polymer gratings as light couplers into porous silicon planar waveguides for sensing applications. Experimental evidence of a guided mode in a grating-coupled porous silicon structure is presented, along with a study of its detuning due to waveguide infiltration with a chemical linker. All the measurements are in good agreement with simulations obtained by means of a Fourier modal method, where the porous silicon birefringence is considered. These results demonstrate that this system is potentially useful for chemical and biological sensing applications.

Published in:
Journal of Applied Physics  (Volume:104 ,  Issue: 12 )

Date of Publication: Dec 2008

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.