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Thickness-independent electron field emission from tetrahedral amorphous carbon films

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5 Author(s)
Zhao, J.P. ; Ion Beam Laboratory, Shanghai Institute of Metallurgy, Chinese Academy of Sciences, Shanghai 200050, People’s Republic of ChinaShikoku National Industrial Research Institute, Takamatsu 761-0395, Japan ; Chen, Z.Y. ; Wang, X. ; Shi, T.S.
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Electron field emission properties of tetrahedral amorphous carbon films of different thicknesses have been studied. The experimental results indicate that there exists no close relationship between threshold electric field and film thickness. Different field emission models are used to examine the experimental results in order to explain the thickness-independent electron field emission properties. © 2000 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:76 ,  Issue: 2 )