Referenced Items are not available for this document.
Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.123137
By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center conductor, allowing different components of the field to be imaged by orienting the probe appropriately. Using a simple model of the microscope, we are able to interpret the system’s output and determine the magnitude of the electric field at the probe tip. We show images of electric field components above a copper microstrip transmission line driven at 8 GHz, with a spatial resolution of approximately 200 μm. © 1999 American Institute of Physics.
Published in:
Applied Physics Letters
(Volume:74
,
Issue:
1
)
Date of Publication: Jan 1999
- Page(s):
- 156 - 158
- ISSN :
- 0003-6951
- Digital Object Identifier :
- 10.1063/1.123137
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 17 May 2012
- Issue Date :
- Jan 1999
About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies
A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.
