Cart (Loading....) | Create Account
Close category search window

Applications of universal context modeling to lossless compression of gray-scale images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Weinberger, M.J. ; IBM Almaden Res. Center, San Jose, CA, USA ; Rissanen, J. ; Arps, R.B.

Inspired by theoretical results on universal modeling, a general framework for sequential modeling of gray-scale images is proposed and applied to lossless compression. The model is based on stochastic complexity considerations and is implemented with a tree structure. It is efficiently estimated by a modification of the universal algorithm context. Several variants of the algorithm are described. The sequential, lossless compression schemes obtained when the context modeler is used with an arithmetic coder are tested with a representative set of gray-scale images. The compression ratios are compared with those obtained with state-of-the-art algorithms available in the literature, with the results of the comparison consistently favoring the proposed approach

Published in:

Image Processing, IEEE Transactions on  (Volume:5 ,  Issue: 4 )

Date of Publication:

Apr 1996

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.