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Shared-I/O scan test

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1 Author(s)
B. I. Dervisoglu ; Silicon Graphics Inc., Mountain View, CA, USA

The IEEE P1149.2 standard seeks to implement several new features, such as shared-I/O cells, an optional parallel-update stage, and a high-impedance input pin. Although aspects of these features are incompatible with IEEE Std 1149.1, the working group strives to make P1149.2 consistent with the existing standard's primary goals.

Published in:

IEEE Design & Test of Computers  (Volume:12 ,  Issue: 4 )