Shared-I/O scan test
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The IEEE P1149.2 standard seeks to implement several new features, such as shared-I/O cells, an optional parallel-update stage, and a high-impedance input pin. Although aspects of these features are incompatible with IEEE Std 1149.1, the working group strives to make P1149.2 consistent with the existing standard's primary goals.
Published in:
Design & Test of Computers, IEEE
(Volume:12
,
Issue:
4
)
Date of Publication: Winter 1995