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Recent trends in single-event effect ground testing

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2 Author(s)
Duzellier, S. ; ONERA-CERT, Toulouse, France ; Ecoffet, R.

Single-event phenomena result from a single particle, heavy ion or proton, inducing transients in the sensitive volume of integrated circuits. Particle accelerators are used to simulate the space environment in order to perform a full characterization of the components. This paper describes the methods and facilities necessary for single-event effect (SEE) testing as well as recent trends observed in the device response to radiation

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Nuclear Science, IEEE Transactions on  (Volume:43 ,  Issue: 2 )