Referenced Items are not available for this document.
Analog and mixed-signal integrated circuits are also susceptible to single-event effects, but they have rarely been tested. Analog circuit single-particle transients require modified test techniques and data analysis. Existing work is reviewed and future concerns are outlined
Published in:
Nuclear Science, IEEE Transactions on
(Volume:43
,
Issue:
2
)
Date of Publication: Apr 1996
- Page(s):
- 594 - 602
- ISSN :
- 0018-9499
- INSPEC Accession Number:
- 5277111
- Digital Object Identifier :
- 10.1109/23.490903
- Product Type:
- Journals & Magazines
- Date of Current Version :
- 06 August 2002
- Issue Date :
- Apr 1996
- Sponsored by :
- IEEE Nuclear and Plasma Sciences Society
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