By Topic

Nonlinearity characterisation of microwave detectors for radiometer applications

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Narhi, T. ; RF Syst. Div., Eur. Space Res. & Technol. Centre, Noordwijk, Netherlands

The accuracy of microwave radiometers is affected by the deviation of the detector from the ideal square-law behaviour. A method is presented for determining the error caused by higher order nonlinearities, based on the experimental characterisation of the nonlinearities with a two-tone test. In actual operation with Gaussian noise as the input signal, the error caused by higher order nonlinearities is found to be greater than that with sinusoidal input signal

Published in:

Electronics Letters  (Volume:32 ,  Issue: 3 )