By Topic

Visualizing metrics on areas of interest in software architecture diagrams

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Byelas, H. ; Inst. of Math. & Comput. Sci., Univ. of Groningen, Groningen ; Telea, A.

We present a new method for the combined visualization of software architecture diagrams, such as UML class diagrams or component diagrams, and software metrics defined on groups of diagram elements. Our method extends an existing rendering technique for the so-called areas of interest in system architecture diagrams to visualize several metrics, possibly having missing values, defined on overlapping areas of interest. For this, we use a solution that combines texturing, blending, and smooth scattered-data point interpolation. Our new method simplifies the task of visually correlating the distribution and outlier values of a multivariate metric dataset with a system's structure. We demonstrate the application of our method on component and class diagrams extracted from real-world systems.

Published in:

Visualization Symposium, 2009. PacificVis '09. IEEE Pacific

Date of Conference:

20-23 April 2009