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Writing and reading perpendicular magnetic recording media patterned by a focused ion beam

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5 Author(s)
Lohau, J. ; IBM Almaden Research Center, 650 Harry Road, San Jose, California 95120 ; Moser, A. ; Rettner, C.T. ; Best, M.E.
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We have written and read bit patterns on arrays of square islands cut with a focused ion beam into granular perpendicular magnetic recording media. Using a static write–read tester, we have written square-wave bit patterns on arrays of islands with sizes between 60 and 230 nm, matching the recording linear density to the pattern period. These measurements reveal the onset of single-domain behavior for islands smaller than 130 nm, in agreement with magnetic force microscope images. The recording performance of patterned regions is systematically compared to that of unpatterned regions. © 2001 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:78 ,  Issue: 7 )

Date of Publication:

Feb 2001

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