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Optical gate action of a molecular thin film probed with femtosecond near-field optical microscopy

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7 Author(s)
Kawashima, H. ; Electrotechnical Laboratory, Umezono 1-1-4, Tsukuba, Ibaraki 305-8568, Japan ; Furuki, M. ; Tatsuura, S. ; Tian, M.
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We have combined a near-field scanning optical microscope with a two-color time-resolved pump–probe measurement system. The sample was a molecular thin film that revealed an excitonic resonance and also had a characteristic domain structure. The measurement system has a noise-equivalent transmittance change as small as 5.0×10-5 for a probe pulse with an intensity of 30 nW, which allows us to detect an optical gate action of a single domain. The results suggest that the film composition is uniform over a distance of several microns while it may vary on a greater scale. © 2000 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:77 ,  Issue: 9 )

Date of Publication:

Aug 2000

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