By Topic

Measurement of nanohardness and nanoelasticity of thin gold films with scanning force microscope

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kracke, B. ; I. Physikalisches Institut, Universität Göttingen, Bunsenstrasse 9, 37073 Göttingen, Germany ; Damaschke, B.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.126976 

With a scanning force microscope operating in ultrahigh vacuum, we measured local mechanical properties of single crystalline gold islands. The elastic moduli of the gold islands and the substrates sapphire, mica, and quartz were evaluated from force-distance curves. The value of Young’s elastic modulus in [111] direction of the gold grains is (50±16) GPa and was found to be significantly smaller than the bulk modulus of gold. With an indentation technique, the nanohardness of gold islands was investigated. The nanohardness is smaller than the bulk value and depends on the indentation area. This can be interpreted as nanohardening by dislocation interaction in very pure single crystals. © 2000 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:77 ,  Issue: 3 )