Close category search window
 

Many-particle effects in Ge quantum dots investigated by time-resolved capacitance spectroscopy

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

8 Author(s)
Kapteyn, C.M.A. ; Institut für Festkörperphysik, Technische Universität Berlin, Hardenbergstr. 36, 10623 Berlin, Germany ; Lion, M. ; Heitz, R. ; Bimberg, D.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.1334651 

Hole emission from self-organized Ge quantum dots with a diameter of ∼70 nm in a Si matrix is investigated by time-resolved capacitance spectroscopy [deep level transient spectroscopy (DLTS)]. A complex DLTS signal is observed and explained in terms of thermally activated emission from localized many-particle states. In particular, a gradually decreasing activation energy is found with increasing hole population. A qualitative understanding of the DLTS signal and the observed activation energies is achieved in terms of many-particle states determined by quantization and Coulomb charging. © 2000 American Institute of Physics.

Published in:
Applied Physics Letters  (Volume:77 ,  Issue: 25 )

Date of Publication: Dec 2000

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.