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In this letter, we present a promising scanning probe microscopy mode, called combined dynamic X mode or short CODYMode®. In CODYMode® scanning force microscopy, at least two modulations with sufficiently different frequencies and amplitudes are superpositioned and interact with the sample surface. This enables the concurrent measurement of the topography, adhesive and frictional forces, and further mechanical surface properties of the sample. The general advantages of CODYMode® are discussed. This technique is predestined for investigation of delicate samples (polymers, biological samples, etc.) in which common scanning force microscope techniques are not adequate. An ABC-triblock copolymer system served as sample system. © 2000 American Institute of Physics.
Published in:
Applied Physics Letters
(Volume:77
,
Issue:
23
)
Date of Publication: Dec 2000