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Terahertz near-field microscopy based on a collection mode detector

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7 Author(s)
Mitrofanov, O. ; Department of Physics, New Jersey Institute of Technology, Newark, New Jersey 07102Bell Laboratories, Lucent Technologies, 600 Mountain Avenue, Murray Hill, New Jersey 07974 ; Brener, I. ; Harel, R. ; Wynn, J.D.
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We report on the development of a collection mode near-field probe for the terahertz spectral range. The near-field detector is based on an aperture type probe with dimensions of 30×30 μm2. The collection mode technique provides higher sensitivity and higher resolution than the similar illumination mode approach. Spatial resolution better than 40 μm is demonstrated for a broad spectrum of 300–600 μm, which equals to λ/15 for the longest wavelength. The observed resolution is determined by the size of the probe aperture. © 2000 American Institute of Physics.

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Applied Physics Letters  (Volume:77 ,  Issue: 22 )