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Room-temperature minority-carrier injection-enhanced recovery of radiation-induced defects in p-InGaP and solar cells

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5 Author(s)
Khan, Aurangzeb ; Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, Japan ; Yamaguchi, M. ; Bourgoin, Jacques C. ; de Angelis, N.
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We present here the direct observation of minority-carrier injection-enhanced annealing of radiation-induced defects in metalorganic chemical vapor deposition grown p-InGaP at room temperature, and the consequent recovery of radiation damage in InGaP n+-p junction solar cells. Deep level transient spectroscopy analysis shows that the main defect H2 (Ev+0.55 eV) in p-InGaP exhibits minority-carrier injection-enhanced annealing characterized by an activation energy (ΔE=0.51 eV) close to the activation energy for the recovery (ΔE=0.54 eV) of the defect responsible for diffusion length degradation in n+-p solar cells. The marked recovery of radiation damage in InGaP solar cells induced by minority-carrier injection is found to be correlated with the annihilation of the H2 defect. © 2000 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:76 ,  Issue: 18 )