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Fundamental limits to magnetic-field sensitivity of flux-gate magnetic-field sensors

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3 Author(s)
Koch, R.H. ; Thomas J. Watson Research Center, IBM, Yorktown Heights, New York 10598 ; Deak, J.G. ; Grinstein, G.

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In this letter we determine the theoretical limit of the magnetic-field sensitivity of the flux-gate magnetometer. In order to do so, we have developed a model for the white noise of a flux gate based on the fundamental dynamics of the magnetic material forming the flux-gate core. Solving this model, we predict that the white noise of a physically realizable flux gate with a volume of 2×10-8m3 is less than

100 fT/ Hz .
The white noise varies with the lossy susceptibility of the core and inversely with the volume. We also compare the measured white noise of a thin-film flux gate with the predictions of our model and find that the measured and predicted noise agree reasonably well. © 1999 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:75 ,  Issue: 24 )