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A system for measuring transmittance of electromagnetic waves in the sub-THz region is proposed. The electromagnetic radiation is generated by the excitation of a photoconductive antenna with a commercially available multimode laser diode. The spectral coverage of the radiation is increased by defocusing the light spot on the photoconductive antenna. Transmitted radiation is detected by a hot-electron bolometer through a Martin–Puplett-type interferometer. Transmittance is measured for n-type Si wafers with various doping levels. The carrier densities calculated from the transmittance agree well with those obtained from the dc conductivity measurement. © 1999 American Institute of Physics.