By Topic

Erratum: “Structure control and characterization of SrBi2Ta2O9 thin films by a modified annealing method” [Appl. Phys. Lett. 74, 1221 (1999)]

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
6 Author(s)
Hu, G. D. ; Department of Electronic Engineering and Materials Science and Technology Research Center, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong ; Wilson, I. H. ; Xu, J. B. ; Cheung, W. Y.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.124947 

© 1999 American Institute of Physics.

Published in:

Applied Physics Letters  (Volume:75 ,  Issue: 14 )